The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 03, 2013

Filed:

May. 30, 2008
Applicants:

Ying Chen, Beijing, CN;

Evelyn Duesterwald, Ossining, NY (US);

Ying LI, Beijing, CN;

Qi Ming Teng, Beijing, CN;

Inventors:

Ying Chen, Beijing, CN;

Evelyn Duesterwald, Ossining, NY (US);

Ying Li, Beijing, CN;

Qi Ming Teng, Beijing, CN;

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 15/173 (2006.01); G06F 11/00 (2006.01); G06F 9/44 (2006.01); G01R 11/00 (2006.01); G01R 31/28 (2006.01);
U.S. Cl.
CPC ...
Abstract

Adaptive profiling for performance analysis of a computer system controls one or more agents to monitor a plurality of events occurring in a target computer system based on an adaptive logic. Collected data may be filtered and analyzed to determine one or more contributor events that attribute to performance of the target computer system. One or more patterns are observed or detected in said collected data, behavior of said one or more agents are adjusted based on said detected one or more patterns. The adaptive logic may be further reconfigured based on said detected one or more patterns.


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