The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 03, 2013

Filed:

Aug. 10, 2009
Applicants:

Zhen Guo, Elkins Park, PA (US);

Zhongfei (Mark) Zhang, Vernon, CT (US);

Inventors:

Zhen Guo, Elkins Park, PA (US);

Zhongfei (Mark) Zhang, Vernon, CT (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 15/18 (2006.01); G06E 1/00 (2006.01); G06E 3/00 (2006.01); G06G 7/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

Semi-supervised learning plays an important role in machine learning and data mining. The semi-supervised learning problem is approached by developing semiparametric regularization, which attempts to discover the marginal distribution of the data to learn the parametric function through exploiting the geometric distribution of the data. This learned parametric function can then be incorporated into the supervised learning on the available labeled data as the prior knowledge. A semi-supervised learning approach is provided which incorporates the unlabeled data into the supervised learning by a parametric function learned from the whole data including the labeled and unlabeled data. The parametric function reflects the geometric structure of the marginal distribution of the data. Furthermore, the proposed approach which naturally extends to the out-of-sample data is an inductive learning method in nature.


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