The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 03, 2013
Filed:
Aug. 31, 2010
Thomas W. Chang, Sunnyvale, CA (US);
Peter Bevelacqua, Cupertino, CA (US);
Thomas W. Chang, Sunnyvale, CA (US);
Peter Bevelacqua, Cupertino, CA (US);
Apple Inc., Cupertino, CA (US);
Abstract
Calibration equipment for calibrating multiple test stations in a test system is provided. Each test station may include a test unit, a test chamber with multiple antennas, and radio-frequency (RF) cables that connect the test unit to the multiple antennas within the test chamber. Reference devices under test (DUTs) may be used to calibrate the OTA path loss of each test station while switching one of the multiple antennas into use one at a time at desired frequencies. A preferred antenna list indicating the preferred antenna that provides the optimal path loss for each desired frequency may be generated. Once calibrated, the test stations may be used during product testing to test factory DUTs to determine whether a particular production DUT satisfies pass/fail criteria. During product testing, a selected one of the multiple antennas is enabled based on the preferred antenna list to perform desired measurements.