The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 03, 2013

Filed:

Jun. 30, 2010
Applicants:

Aravind Kailas, Atlanta, GA (US);

Chia-chin Chong, Santa Clara, CA (US);

Fujio Watanabe, Union City, CA (US);

Inventors:

Aravind Kailas, Atlanta, GA (US);

Chia-Chin Chong, Santa Clara, CA (US);

Fujio Watanabe, Union City, CA (US);

Assignee:

NTT DoCoMo, Inc., Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 31/00 (2006.01); G01N 33/48 (2006.01); G01N 33/50 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method for detecting a subject's stress level associated with an activity includes (a) connecting the subject to a sensor that senses a value of a biometric; (b) during the activity, (i) repeatedly sensing the value of the biometric over each of a plurality of time windows; and (ii) computing, for each time window, a deviation in the sensed values of the biometric; and (c) detecting the stress level based on the computed deviations. In one implementation, the value of the biometric is a skin temperature measurement. The method may be implemented as an application in a wireless handheld device, such as a cellular telephone.


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