The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 03, 2013

Filed:

May. 27, 2008
Applicants:

Andrew John Carnegie, Kuala Lumpur, MY;

Benoit Couet, Belmont, MA (US);

Michael Prange, Somerville, MA (US);

William John Bailey, Somerville, MA (US);

Ibrahim Pamir Bursin, Kuala Lumpur, MY;

Stephen Flew, Kuala Lumpur, MY;

Inventors:

Andrew John Carnegie, Kuala Lumpur, MY;

Benoit Couet, Belmont, MA (US);

Michael Prange, Somerville, MA (US);

William John Bailey, Somerville, MA (US);

Ibrahim Pamir Bursin, Kuala Lumpur, MY;

Stephen Flew, Kuala Lumpur, MY;

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01V 9/00 (2006.01); G06F 19/00 (2011.01); G06G 7/48 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method of determining a selection of well measurements and/or their respective control parameters is described based on a global target having predetermined sensitivities to a multitude of uncertainties associated with input variables to a model including the step of ranking measurements and control parameters in accordance with their capability to reduce the uncertainties of input variables identified as most sensitive input variables through simulations using the model or a reduced variant of the model.


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