The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 03, 2013

Filed:

Oct. 02, 2008
Applicants:

Shay Assaf, Cupertino, CA (US);

Venkatesh Babu, San Jose, CA (US);

Robert D. Flores, Campbell, CA (US);

Brendan Hickey, San Francisco, CA (US);

Krishna Kuttannair, San Jose, CA (US);

Song J. Park, Pleasanton, CA (US);

Adrian Rhee, Santa Clara, CA (US);

Chongyang Chris Wang, San Jose, CA (US);

Inventors:

Shay Assaf, Cupertino, CA (US);

Venkatesh Babu, San Jose, CA (US);

Robert D. Flores, Campbell, CA (US);

Brendan Hickey, San Francisco, CA (US);

Krishna Kuttannair, San Jose, CA (US);

Song J. Park, Pleasanton, CA (US);

Adrian Rhee, Santa Clara, CA (US);

Chongyang Chris Wang, San Jose, CA (US);

Assignee:

Applied Materials, Inc., Santa Clara, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 19/00 (2011.01);
U.S. Cl.
CPC ...
Abstract

A method and system for managing process jobs in a semiconductor fabrication facility is described. In one embodiment, the method includes receiving a plurality of process jobs associated with one or more priorities. The method further includes executing the plurality of process jobs in an order reflecting the priorities. The order is modifiable in real time upon receiving a new process job with a priority higher than the priorities of the plurality of process jobs.


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