The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 03, 2013
Filed:
Nov. 01, 2010
David Peter Campbell, Redmond, WA (US);
David Justin Ross, Redmond, WA (US);
Brian J. Elmenhurst, Redmond, WA (US);
Kevin James Saur, Redmond, WA (US);
Richard Clark Teudt, Redmond, WA (US);
David Peter Campbell, Redmond, WA (US);
David Justin Ross, Redmond, WA (US);
Brian J. Elmenhurst, Redmond, WA (US);
Kevin James Saur, Redmond, WA (US);
Richard Clark Teudt, Redmond, WA (US);
RAF Technology, Inc., Redmond, WA (US);
Abstract
A method of defining data patterns for object handling includes obtaining an image of an input data area, processing the image to obtain image data, and comparing the image data with a pattern, wherein the pattern identifies spatial information of corresponding pattern fields of the pattern. The method further includes determining a confidence level of the comparison of the image data according to a success in matching the image data with the pattern fields, comparing the confidence level with a confidence threshold associated with the pattern, and selecting the pattern. A pattern output associated with the selected pattern is identified, wherein the pattern output corresponds to a canonical return format, and the pattern output is applied to the image data.