The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 03, 2013
Filed:
Oct. 18, 2010
Brent Jason Lavin, Wauwatosa, WI (US);
Menachem Halmann, Wauwatosa, WI (US);
Brent Jason Lavin, Wauwatosa, WI (US);
Menachem Halmann, Wauwatosa, WI (US);
General Electric Company, Schenectady, NY (US);
Abstract
Systems and methods for determining scan parameters to be used during image acquisition are provided. Values of imaging effects can be input using user controls accessible from a user interface. A processor can determine scan parameters to be used during image acquisition based on the input imaging effect values. The determined scan parameters can be displayed using the user interface. Values of imaging effects and potential ranges of values of imaging effects can be constrained based on selected values of other imaging effects. Imaging effects can include image resolution, image penetration, frame rate and/or color flow sensitivity. Scan parameters can include: line density, number of focal zones, frequency, dynamic range, pulse repetition frequency, and/or number of compounding angles. An ultrasound imaging system can be used to acquire images using the determined scan parameters.