The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 03, 2013

Filed:

Jan. 06, 2012
Applicants:

Steven R. J. Brueck, Alburquerque, NM (US);

Yuliya Kuznetsova, Albuquerque, NM (US);

Alexander Neumann, Albuquerque, NM (US);

Inventors:

Steven R. J. Brueck, Alburquerque, NM (US);

Yuliya Kuznetsova, Albuquerque, NM (US);

Alexander Neumann, Albuquerque, NM (US);

Assignee:

STC.UNM, Albuquerque, NM (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 21/06 (2006.01); G02B 21/00 (2006.01);
U.S. Cl.
CPC ...
G02B 21/0032 (2013.01); G02B 21/00 (2013.01);
Abstract

In accordance with the invention, there are imaging interferometric microscopes and methods for imaging interferometric microscopy using structural illumination and evanescent coupling for the extension of imaging interferometric microscopy. Furthermore, there are coherent anti-Stokes Raman (CARS) microscopes and methods for coherent anti-Stokes Raman (CARS) microscopy, wherein imaging interferometric microscopy techniques are applied to get material dependent spectroscopic information.


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