The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 03, 2013
Filed:
Sep. 28, 2010
James E. Mason, Palo Alto, CA (US);
Melvin S. NI, Cupertino, CA (US);
Gregory S. Feller, Kentfield, CA (US);
James E. Mason, Palo Alto, CA (US);
Melvin S. Ni, Cupertino, CA (US);
Gregory S. Feller, Kentfield, CA (US);
Lockheed Martin Corporation, Bethesda, MD (US);
Abstract
A system and method of calibrating an optical measurement system utilizing polarization diversity is disclosed. A waveplate having a rotation axis is provided. A first light polarization component and a second light polarization component are caused to propagate in the waveplate while the waveplate is rotated about the rotation axis. An equal common phase shift is caused in the first and second light polarization components while a differential phase shift in the first and second light polarization components is maintained. A relative phase between the first and second light polarization components is sensed. At least one calibration parameter is determined based on the relative phase.