The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 8525711 B1

PDF
Full Text
Expired
Date of Patent:
Sep. 03, 2013

Filed:

Jun. 24, 2011
Applicant:

Yung-hui Chung, Hsinchu, TW;

Inventor:

Yung-Hui Chung, Hsinchu, TW;

Assignee:

Mediatek Inc., Science-Based Industrial Park, Hsin-Chu, TW;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H03M 1/06 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method for performing nonlinearity calibration includes the steps of: obtaining temporarily values of a plurality of compensation parameters by performing a perturbation-based calibration process on a nonlinear system with at least one predetermined input being applied to the nonlinear system; and updating the compensation parameters by performing the perturbation-based calibration process in an online manner, wherein the temporarily values are utilized as initial values of the compensation parameters for the step of updating the compensation parameters. In addition, the compensation parameters are utilized for controlling a compensation response of the perturbation-based calibration process. An associated apparatus is also provided.


Find Patent Forward Citations

Chung, Yung-Hui. (2013). Method and apparatus for performing nonlinearity calibration (U.S. Patent No. 8525711). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8525711

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