The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 03, 2013

Filed:

Apr. 24, 2012
Applicants:

Andreas G. Goedicke, Aachen, DE;

Herfried K. Wieczorek, Aachen, DE;

Ralf Dorscheid, Kerkrade, NL;

Michael Schaff, Herzogenrath, DE;

Inventors:

Andreas G. Goedicke, Aachen, DE;

Herfried K. Wieczorek, Aachen, DE;

Ralf Dorscheid, Kerkrade, NL;

Michael Schaff, Herzogenrath, DE;

Assignee:

Koninklijke Philips N.V., Eindhoven, NL;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01T 1/166 (2006.01);
U.S. Cl.
CPC ...
Abstract

In a disclosed imaging method, the instantaneous speed or data acquisition dwell times of a detector head is optimized as a function of position along a path of the detector head around a subject. The optimization is respective to an expected radioactive emission profile of a region of interest that is less than the entire subject. The detector head is traversed along the path using the optimized instantaneous speed or data acquisition dwell times. During the traversing, imaging data are acquired using the detector head. The acquired imaging data are reconstructed to generate a reconstructed image of at least the region of interest. A gamma camera configured to perform the foregoing imaging method is also disclosed.


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