The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 03, 2013
Filed:
Jan. 17, 2012
Dmitry R. Bandura, Ontario, CA;
Vladimir I. Baranov, Ontario, CA;
Scott D. Tanner, Ontario, CA;
PerkinElmer Health Sciences, Inc., Waltham, MA (US);
Abstract
An analytical instrument has a sample introduction system for generating a stream of particles from a sample and an ionization system for receiving the particles. The ionization system is operable to atomize the particles received from the sample introduction system and ionize atoms from the atomized particles. The instrument has an ion pretreatment system and a magnetic sector mass analyzer comprising an array detector. The ion pretreatment system is adapted to transport ions generated by the ionization system to the mass analyzer. The mass analyzer is adapted to detect a transient signal of at least one element from individual particles from said stream by performing mass analysis on the ions from the atomized particles. The magnetic sector mass analyzer is adapted determine an amount of said at least one element from an individual particle using the transient signal detected during mass analysis of the ions from said individual particle.