The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 03, 2013
Filed:
Sep. 11, 2011
Applicants:
Xiquan Cui, Pasadena, CA (US);
Changhuei Yang, Pasadena, CA (US);
Guillermo J. Tearney, Cambridge, MA (US);
Inventors:
Xiquan Cui, Pasadena, CA (US);
Changhuei Yang, Pasadena, CA (US);
Guillermo J. Tearney, Cambridge, MA (US);
Assignee:
California Institute of Technology, Pasadena, CA (US);
Primary Examiner:
Int. Cl.
CPC ...
G01J 1/20 (2006.01);
U.S. Cl.
CPC ...
Abstract
Embodiments of the present invention relate to a wavefront sensor comprising a film and a photodetector. The film has one or more structured two dimensional apertures configured to convert a phase gradient of a wavefront into a measurable form. The photodetector is configured to receive the wavefront through the one or more 2D apertures and measure the phase gradient of the wavefront.