The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 27, 2013
Filed:
Jan. 29, 2011
Correcting memory device and memory channel failures in the presence of known memory device failures
Luiz C. Alves, Hopewell Junction, NY (US);
Luis A. Lastras-montano, Corlandt Manor, NY (US);
Patrick J. Meaney, Poughkeepsie, NY (US);
Eldee Stephens, Waterbury, CT (US);
Barry M. Trager, Yorktown Heights, NY (US);
Luiz C. Alves, Hopewell Junction, NY (US);
Luis A. Lastras-Montano, Corlandt Manor, NY (US);
Patrick J. Meaney, Poughkeepsie, NY (US);
Eldee Stephens, Waterbury, CT (US);
Barry M. Trager, Yorktown Heights, NY (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
Correcting memory device (chip) and memory channel failures in the presence of known memory device failures. A memory channel failure is located and corrected, or alternatively up to c chip failures are corrected and up to d chip failures are detected in the presence of up to u chips that are marked as suspect. A first stage of decoding is performed that results in recovering an estimate of correctable errors affecting the data or in declaring an uncorrectable error state. When an uncorrectable error state is declared, a second stage of decoding is performed to attempt to correct u erasures and a channel error in M iterations where the channel location is changed in each iteration. A correctable error is declared in response to exactly one of the M iterations being successful.