The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 8522097 B1

PDF
Full Text
Expired
Date of Patent:
Aug. 27, 2013

Filed:

Mar. 16, 2010
Applicants:

Hong S. Kim, Austin, TX (US);

Paul F. Policke, Austin, TX (US);

Paul Douglas Bassett, Austin, TX (US);

Inventors:

Hong S. Kim, Austin, TX (US);

Paul F. Policke, Austin, TX (US);

Paul Douglas Bassett, Austin, TX (US);

Assignee:

QUALCOMM Incorporated, San Diego, CA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/28 (2006.01);
U.S. Cl.
CPC ...
Abstract

In a particular embodiment, a method is disclosed that includes mapping failing bit positions within multiple scan chains to memory locations of a memory mask. The method also includes executing logic built-in self-test (LBIST) testing on a semiconductor device using the memory mask to selectively mask certain results within the multiple scan chains. The results are associated with performance of LBIST testing on the semiconductor device.


Find Patent Forward Citations

Kim, Hong. (2013). Logic built-in self-test programmable pattern bit mask (U.S. Patent No. 8522097). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8522097

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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