The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 27, 2013

Filed:

Apr. 28, 2000
Applicants:

Brian B. Moore, Poughkeepsie, NY (US);

Gregory A. Burke, Poughkeepsie, NY (US);

David E. Lee, Rochester, MN (US);

Inventors:

Brian B. Moore, Poughkeepsie, NY (US);

Gregory A. Burke, Poughkeepsie, NY (US);

David E. Lee, Rochester, MN (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

Object-code instruction traces are employed to analyze selected instructions of a year-2000 (Y2K) remediated application program for possible remediation failure when confronted by a year-2000 date. The analysis includes directly identifying one or more instructions of the remediated application program that may fail. A remediation-failure-pattern descriptor is assigned to each examined instruction which is indicative of whether the remediated instruction may fail when confronted by a date in the year-2000 range. The analysis employs user-specifiable run-control values, as well as predetermined filter-specification values in comparing traces of each selected object-code instruction to predefined remediation-failure patterns.


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