The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 27, 2013

Filed:

Aug. 03, 2004
Applicants:

Scott Joseph Colbeck, San Jose, CA (US);

Vandana Gupta, San Jose, CA (US);

Jian Xu, San Jose, CA (US);

Inventors:

Scott Joseph Colbeck, San Jose, CA (US);

Vandana Gupta, San Jose, CA (US);

Jian Xu, San Jose, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 7/00 (2006.01); G06F 17/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

An apparatus, system, and method are disclosed for selecting optimal replica sources in a grid computing environment. As disclosed, the present invention overcomes shortcomings in the art involving location and selection of replica sources. In particular, the present invention selects an optimal replica source based on current and historical network statistics, as well as user-defined policies. The user-defined policies allow for customization of the replica source search, and the option of obtaining multiple ranked sources for parallel data transfer.


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