The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 27, 2013
Filed:
Nov. 12, 2009
Joseph M. Kesler, Cincinnati, OH (US);
Uriah M. Liggett, Independence, KY (US);
Richard A. Roth, Ii, Cincinnati, OH (US);
Thomas D. Sharp, Terrace Park, OH (US);
Joseph M. Kesler, Cincinnati, OH (US);
Uriah M. Liggett, Independence, KY (US);
Richard A. Roth, II, Cincinnati, OH (US);
Thomas D. Sharp, Terrace Park, OH (US);
Etegent Technologies, Ltd., Cincinnati, OH (US);
Abstract
Embodiments of the invention include methods to manage non-destructive evaluation ('NDE') data. The method includes receiving NDE data for at least a portion of an asset along with inspection information associated with the at least a portion of the asset, and determining at least one alignment algorithm to align the NDE data to a simulated model of the at least a portion of the asset based on at least one of the NDE data or the inspection information. The method further includes automatically aligning The NDE data to the simulated model with the at least one alignment algorithm and analyzing the aligned NDE data on the simulated model to determine coverage of the simulated model by the NDE data. Additional methods include retrieving NDE data that has previously been aligned to the simulated model and determining coverage or determining trends associated with indications thereof.