The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 27, 2013
Filed:
Aug. 13, 2010
Sourav Banerjee, Santa Clara, CA (US);
Xinlin Qing, Cupertino, CA (US);
Shawn J. Beard, Livermore, CA (US);
Fu-kuo Chang, Stanford, CA (US);
Sourav Banerjee, Santa Clara, CA (US);
Xinlin Qing, Cupertino, CA (US);
Shawn J. Beard, Livermore, CA (US);
Fu-Kuo Chang, Stanford, CA (US);
Acellent Technologies, Inc., Sunnyvale, CA (US);
Abstract
Detecting damage in a structure without comparing sensor signals to a baseline signal. Once a structure is interrogated, a process based on a Gaussian Mixture Model is applied to the resulting data set, resulting in quantities for which Mahalanobis distances and Euclidian distances can be determined. A damage index is then determined based on the calculated Euclidian distance. A high value of this damage index coupled with an abrupt change in Mahalanobis distance has been found to be a reliable indicator of damage. Other embodiments may employ a baseline, but determine damage according to ratios of energy values between current and baseline signals.