The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 27, 2013

Filed:

Oct. 11, 2004
Applicant:

Michael George Bonner, Wauwatosa, WI (US);

Inventor:

Michael George Bonner, Wauwatosa, WI (US);

Assignee:

General Electric Company, Schenectady, NY (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B 5/05 (2006.01);
U.S. Cl.
CPC ...
Abstract

Method and system for scanning a patient using a medical imaging system is described. The described method includes measuring a signal-to-noise ratio of an acquired data and/or reconstructed image and comparing the same with a selectable signal-to-noise ratio threshold. The method further includes controlling a remainder of the scan based on the comparison.


Find Patent Forward Citations

Bonner, Michael. (2013). Method and system for providing a noise based scan control (U.S. Patent No. 8521251). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8521251

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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