The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 8521179 B1

PDF
Full Text
Expired
Date of Patent:
Aug. 27, 2013

Filed:

Nov. 19, 2009
Applicant:

Naoto Hasegawa, Toyota, JP;

Inventor:

Naoto Hasegawa, Toyota, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04W 24/00 (2009.01); H04B 17/00 (2006.01); G01S 19/39 (2010.01); G01S 19/40 (2010.01); G01S 19/45 (2010.01); G01S 19/07 (2010.01); G01S 19/23 (2010.01); G01S 19/25 (2010.01); G01S 5/10 (2006.01); H04B 7/216 (2006.01);
U.S. Cl.
CPC ...
Abstract

A mobile unit's position measurement apparatus is provided. The apparatus includes an observation data selection portion that calculates a plurality of estimated error values that correspond respectively to the plurality of pieces of observation data obtained by observing the signals received by the reception portion, that generates groups each of which includes estimated error values corresponding to at least a predetermined number of satellites, and then extracts, from the estimated error value groups generated, in which a difference between a maximum value and a minimum value of the estimated error values included is less than a predetermined value, and that consequently selects pieces of observation data provided by the signals from the satellites that correspond to the estimated error values that are included in an estimated error value group whose standard deviation of the estimated error values is smallest among the estimated error value groups extracted.


Find Patent Forward Citations

Hasegawa, Naoto. (2013). Mobile unit's position measurement apparatus and mobile unit's position measurement method (U.S. Patent No. 8521179). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8521179

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