The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 27, 2013
Filed:
Nov. 10, 2008
Tatsuo Akiyama, Tokyo, JP;
Tatsuo Akiyama, Tokyo, JP;
NEC Corporation, Tokyo, JP;
Abstract
The arrangements of feature points are computed based on feature points acquired from checking target images. The feature amount having invariants as elements regarding a geometrical transformation is generated for each of the checking target images based on a computed result. And when checking whether or not the feature point arrangements of the checking target images are the same feature point arrangements by using the feature point amounts of the checking target images, at least each of the feature point arrangements that are bases for generating the feature amounts is stored, and a parameter regarding the geometrical transformation is computed based on the feature point arrangements of the checking target images. By utilizing the computed parameter regarding the geometrical transformation, whether or not the feature point arrangements of the checking target images are the same feature point arrangements is checked.