The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 27, 2013
Filed:
Apr. 12, 2006
Andreas Schilling, Gomaringen, DE;
Andreas Schilling, Gomaringen, DE;
Other;
Abstract
A method for visually displaying and/or evaluating measurement data from imaging methods involve the following acts: a) calculating a parameterized statistical model from example voxel data sets that map different objects of an identical object class; b) carrying out at least one imaging method on an object to be examined of the object class in order to extract real measurement data; c) setting a set of model parameters of the parameterized statistical model; d) determining a difference between the real measurement data and the parameterized statistical model; e) repeating steps c) and d) while changing the model parameters until the difference between the real measurement data and the parameterized statistical model is minimal; and f) visually displaying and/or evaluating the statistical model parameterized in aforementioned manner.