The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 27, 2013

Filed:

Oct. 20, 2007
Applicants:

Sung-ik Park, Daejon, KR;

Hyoung-soo Lim, Daejon, KR;

Heung-mook Kim, Daejon, KR;

Jong-soo Lim, Daejon, KR;

Soo-in Lee, Daejon, KR;

Inventors:

Sung-Ik Park, Daejon, KR;

Hyoung-Soo Lim, Daejon, KR;

Heung-Mook Kim, Daejon, KR;

Jong-Soo Lim, Daejon, KR;

Soo-In Lee, Daejon, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04L 27/28 (2006.01); H04B 15/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

Provided is a channel estimation apparatus and method using a linear/nonlinear average in a wireless communication system. The present research provides a channel estimation apparatus and method for estimating a channel between a transmitter and a receiver from a pilot-inserted OFDM signal and linearly or nonlinearly averaging the estimating channel, thereby preventing the equalizer performance from being degraded by noise component of the estimated channel and noise amplification caused by deep fading. The channel estimation apparatus includes: a channel estimation unit configured to estimate a channel coefficient of a channel between a transmitter and a receiver from a pilot-inserted carrier signal according to pilot arrangement; and a linear/nonlinear averaging unit configured to linearly or nonlinearly averaging the estimated channel coefficient, thereby preventing an equalizer performance from being degraded by noise component existing in the channel and noise amplification caused by deep fading.


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