The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 27, 2013
Filed:
Mar. 26, 2011
Hitoshi Fujino, Tajimi, JP;
Yoshifumi Nakamura, Nagoya, JP;
Hiroyuki Ominato, Nagoya, JP;
Hiroki Yukawa, Nagoya, JP;
Hitoshi Fujino, Tajimi, JP;
Yoshifumi Nakamura, Nagoya, JP;
Hiroyuki Ominato, Nagoya, JP;
Hiroki Yukawa, Nagoya, JP;
Brother Kogyo Kabushiki Kaisha, Nagoya-shi, Aichi-ken, JP;
Abstract
In a scanning optical apparatus, a third optical element is configured such that a first optical axis defined as an optical axis of an incident-side lens surface of the third optical element is inclined in a main scanning plane with respect to a normal line extending from a scanning center on a target surface to be scanned and an intersection point between the first optical axis and the incident-side lens surface is shifted with respect to the normal line, and that a second optical axis defined as an optical axis of an emission-side lens surface is inclined in the main scanning plane with respect to the first optical axis and an intersection point between the second optical axis and the emission-side lens surface is shifted with respect to the first optical axis.