The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 8520220 B1

PDF
Full Text
Expired
Date of Patent:
Aug. 27, 2013

Filed:

Mar. 15, 2012
Applicants:

Kjell Kråkenes, Oslo, NO;

Eivind Kvedalen, Oslo, NO;

Inventors:

Kjell Kråkenes, Oslo, NO;

Eivind Kvedalen, Oslo, NO;

Assignee:

Mettler-Toledo AG, Greifensee, CH;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B 11/30 (2006.01);
U.S. Cl.
CPC ...
Abstract

In an apparatus for measuring the dimensions of an object, an opto-electronic sensor system includes an illumination device which sends light towards the object and a receiving device which receives light reflected from the object. In particular, the apparatus includes means for optically splitting the field of view of the opto-electronic sensor system into a plurality of sectors. Each of these sectors covers at least a partial view of the object under inspection from a unique viewing point. The arrangement of the optical splitting means is selected so that based on the respective field of view and the location of the actual or virtual viewing point of each sector the area on the object surface which is visible from at least one of said viewing points is maximized. The apparatus uses only one opto-electronic sensor, but obtains multi-perspective imaging of the object.


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Kråkenes, Kjell. (2013). Apparatus for measuring the dimensions of an object (U.S. Patent No. 8520220). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8520220

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