The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 27, 2013

Filed:

Oct. 10, 2008
Applicants:

Vincent Couderc, Vemeuil, FR;

Philippe Leproux, Saint Pardoux, FR;

Laurent Lefort, Limoges, FR;

David Bouyge, Saint-Mexant, FR;

Christelle Lesvigne-buy, Les loges en Josas, FR;

Aurelian Crunteanu Stanescu, Couzeix, FR;

Inventors:

Vincent Couderc, Vemeuil, FR;

Philippe LeProux, Saint Pardoux, FR;

Laurent LeFort, Limoges, FR;

David Bouyge, Saint-Mexant, FR;

Christelle Lesvigne-Buy, Les loges en Josas, FR;

Aurelian Crunteanu Stanescu, Couzeix, FR;

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01J 3/30 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method and device is provided for characterizing microscopic elements. A source signal may be chopped by means of microsystems of opto-electromechanical elements (MOEMS), which gives rise to temporal modulation of the excitation signals. The method of characterizing microscopic elements involves propagating a dispersed light source signal, spatially chopping the spectrum of the source signal into at least two excitation signals having predetermined wavelengths λ, coding the excitation signals, focusing the excitation signals in order to generate a sensor signal propagated towards a measurement zone, and analyzing an interaction signal issuing from the interaction of the sensor signal with the microscopic elements situated in the measuring space. The spatial chopping of the spectrum of the source light signal is performed by a microsystem of opto-electromechanical elements (MOEMS).


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