The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 27, 2013

Filed:

Dec. 29, 2007
Applicants:

Randall B. Sprague, Hansville, WA (US);

Christian Dean Dejong, Sammamish, WA (US);

Gregory T. Gibson, Snohomish, WA (US);

Inventors:

Randall B. Sprague, Hansville, WA (US);

Christian Dean DeJong, Sammamish, WA (US);

Gregory T. Gibson, Snohomish, WA (US);

Assignee:

Microvision, Inc., Redmond, WA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 3/041 (2006.01);
U.S. Cl.
CPC ...
Abstract

Briefly, in accordance with one or more embodiments, an input device may be utilized in conjunction with a scanned beam display or the like, or may be based on the scanning platform as used in a scanned beam display such as a MEMS based scanner. An input event such as illumination of a photodetector or reflection of a scanned beam off of a retroreflector may be correlated with a timing event of the scanning platform such as a refresh signal, or a horizontal and vertical sync signals. The correlation of the timing event may be representative of an X-Y location, and in some embodiments of a Z location, that may be utilized to provide input data back to a host device.


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