The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 27, 2013
Filed:
Dec. 21, 2009
Karin Topfer, Rochester, NY (US);
Richard T. Scott, Hilton, NY (US);
Timothy J. Wojcik, Rochester, NY (US);
Karin Topfer, Rochester, NY (US);
Richard T. Scott, Hilton, NY (US);
Timothy J. Wojcik, Rochester, NY (US);
Carestream Health, Inc., Rochester, NY (US);
Abstract
A system for monitoring the state of calibration of a digital x-ray detector having a solid state sensor with a plurality of pixels, a scintillating screen and at least one embedded microprocessor, the system having means for capturing a digital image and a computer operable during normal diagnostic use of the detector, in cooperation with at least one embedded microprocessor, for performing pixelwise computations on the image and calculating a misregistration metric indicative of movement of the solid state sensor relative to the scintillating screen. A defect metric indicative of abnormal properties of pixels in the solid state sensor is calculated. It is then determined whether one or both of the misregistration metric and the defect metric exceeds a respective, preselected threshold value. The user of the system is alerted to conduct a calibration of the detector when either one or both of the respective threshold values have been exceeded.