The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 27, 2013
Filed:
Jul. 16, 2012
Applicant:
Hiroyuki Omi, Kawasaki, JP;
Inventor:
Hiroyuki Omi, Kawasaki, JP;
Assignee:
Canon Kabushiki Kaisha, Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01);
U.S. Cl.
CPC ...
Abstract
An X-ray image processing apparatus includes a calculating unit adapted to calculate the noise amount of a sensor on the basis of a difference value of a plurality of dark images acquired at different timings by the sensor when no X-rays are irradiated, a changing unit adapted to change a predetermined parameter for processing an X-ray image acquired by the sensor when X-rays are irradiated, in order to prevent the noise amount from being superposed on the X-ray image, and an image processing unit adapted to perform image processing on the X-ray image on the basis of the changed parameter.