The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 27, 2013
Filed:
Dec. 09, 2010
Applicants:
Yin Le, Shenzhen, CN;
Yu-lin Liu, Shenzhen, CN;
Qiang Zhang, Shenzhen, CN;
Inventors:
Assignees:
Hong Fu Jin Precision Industry (ShenZhen) Co., Ltd., Shenzhen, CN;
Hon Hai Precision Industry Co., Ltd., New Taipei, TW;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 3/00 (2006.01); G01N 19/02 (2006.01);
U.S. Cl.
CPC ...
Abstract
A drop test apparatus includes a base panel, at least one height adjustment member attached to the base panel, and at least one angle adjustment member pivotally attached to the at least one height adjustment member. The at least one height adjustment member has a portion protruding upward from the base panel. A height of the portion is variable. The at least one angle adjustment member is configured for supporting a device thereon and capable of rotating to different angles.