The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 20, 2013
Filed:
Oct. 27, 2010
Bang Liu, Shanghai, CN;
Bohai Liu, Shanghai, CN;
Synopsys (Shanghai) Co., Ltd., Shanghai, CN;
Abstract
Reconstruction methods and devices are disclosed for scan chains in physical design that is based on two-way priority selection. The structural reconstruction method in the scan chains, in the first place, establishes a first preference sequence for a certain number of scanning elements in each of these scan chains as well as a secondary preference sequence for these scan chains in each of these scanning elements respectively. Then, two-way selection is executed between the scan chains and scanning elements based on the corresponding first preference sequence and secondary preference sequence, so that these scanning elements can be redistributed to these scan chains. The structural reconstruction method and device in the invention conduct an integrated optimization for a global scan chain, where the global wiring length is shortened dramatically and the wiring efficiency is improved.