The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 8516311 B1

PDF
Full Text
Expired
Date of Patent:
Aug. 20, 2013

Filed:

Jun. 13, 2011
Applicant:

Chao-tsung Fan, Tu-cheng, TW;

Inventor:

Chao-Tsung Fan, Tu-cheng, TW;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method tests peripheral component interconnect express (PCI-E) switches. A second PCI-E switch to be tested electronically connects to a first PCI-E switch of a computing device. A first data packet is created by the computing device and sent from the first PCI-E switch to the second PCI-E switch. A second data packet sent back by the second PCI-E switch is received by the computing device. The second PCI-E switch works normally if the first data packet is identical to the second data packet. The second PCI-E switch does not work normally if the first data packet is not identical to the second data packet.


Find Patent Forward Citations

Fan, Chao-Tsung. (2013). System and method for testing peripheral component interconnect express switch (U.S. Patent No. 8516311). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8516311

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Loading…