The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 20, 2013

Filed:

Feb. 11, 2011
Applicants:

Naoya Ohnishi, Tokyo, JP;

Hiroshi Nakatani, Tokyo, JP;

Yoshito Sameda, Kanagawa-ken, JP;

Inventors:

Naoya Ohnishi, Tokyo, JP;

Hiroshi Nakatani, Tokyo, JP;

Yoshito Sameda, Kanagawa-ken, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

The embodiments provide a failure diagnosis method for a main memory in an information processing device equipped with a write-back cache. According to the method, an application program stored in the main memory is divided by the storage size of write-back cache, and the regions are stored in advance. Then, a read signal from the main memory to the write-back cache is detected. It is determined whether the region corresponding to the read signal has yet to be diagnosed. If the region has yet to be diagnosed, a command to diagnose failure of the region is issued. If a write signal (write back) to a particular region is detected during the diagnosis of the particular region, the diagnosis of the particular region is stopped. Thus, the failure diagnosis of the main memory is executed in parallel with the execution of the application program.


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