The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 20, 2013

Filed:

Sep. 08, 2010
Applicants:

James Ray Bailey, Georgetown, KY (US);

Christopher Wilson Case, Georgetown, KY (US);

James Patrick Sharpe, Lexington, KY (US);

Inventors:

James Ray Bailey, Georgetown, KY (US);

Christopher Wilson Case, Georgetown, KY (US);

James Patrick Sharpe, Lexington, KY (US);

Assignee:

Lexmark International, Inc., Lexington, KY (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

An integrated circuit including a logic analyzer with enhanced analyzing and debugging capabilities and a method therefore. In one embodiment, an integrated circuit includes a logic analyzer having a first input receiving a plurality of signals and an output for providing an indication of a detection, by the logic analyzer, of at least one trigger event; and a built in self test block having a first input for receiving one or more of the signals appearing at the first input of the logic analyzer, a second input coupled to the output of the logic analyzer for selectively enabling the BIST block, the BIST block generating and maintaining a signature based upon the first and second inputs thereof.


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