The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 20, 2013

Filed:

Jul. 25, 2011
Applicants:

Shanmugasundaram Ravikumar, Berkeley, CA (US);

Anirban Dasgupta, Berkeley, CA (US);

Tamas Sarlos, Sunnyvale, CA (US);

Inventors:

Shanmugasundaram Ravikumar, Berkeley, CA (US);

Anirban Dasgupta, Berkeley, CA (US);

Tamas Sarlos, Sunnyvale, CA (US);

Assignee:

Yahoo! Inc., Sunnyvale, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 17/30 (2006.01);
U.S. Cl.
CPC ...
Abstract

Method, system, and programs for computing similarity. Input data is first received from one or more data sources and then analyzed to obtain an input feature vector that characterizes the input data. An index is then generated based on the input feature vector and is used to archive the input data, where the value of the index is computed based on an improved Johnson-Lindenstrass transformation (FJLT) process. With the improved FJLT process, first, the sign of each feature in the input feature vector is randomly flipped to obtain a flipped vector. A Hadamard transformation is then applied to the flipped vector to obtain a transformed vector. An inner product between the transformed vector and a sparse vector is then computed to obtain a base vector, based on which the value of the index is determined.


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