The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 20, 2013
Filed:
Aug. 06, 2010
Paul M. Ingram, Dallas, TX (US);
Joseph C. Landry, Dallas, TX (US);
John J. Coogan, Bedford, TX (US);
Paul D. Shocklee, Plano, TX (US);
Paul M. Ingram, Dallas, TX (US);
Joseph C. Landry, Dallas, TX (US);
John J. Coogan, Bedford, TX (US);
Paul D. Shocklee, Plano, TX (US);
Raytheon Company, Waltham, MA (US);
Abstract
In accordance with the present disclosure, a computer implemented system and method predicts the performance for a remote material identification process under real conditions and uncertainties. The method and system transforms data representing measured reflectance values for candidate materials based on environmental conditions, and uncertainties regarding the environmental conditions and/or calibration of sensors measuring radiance values into the performance predictions for a material identification process operating under those conditions and uncertainties. The performance predictions can be communicated to a designer of, for example, a multi-angle material identification system for use in selecting and setting up the system, or communicated to a consumer of images captured by the material identification system for use in interpreting results of application of the material identification process to real imagery acquired with remote sensors.