The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 20, 2013
Filed:
Jan. 20, 2011
Steven James Huff, Watertown, WI (US);
Kamal Mannar, Atlanta, GA (US);
Steven James Huff, Watertown, WI (US);
Kamal Mannar, Atlanta, GA (US);
General Electric Company, Schenectady, NY (US);
Abstract
A system for acquiring and analyzing fault conditions for at least one coil of Magnetic Resonance Imaging (MRI) system. Each of the at least one coils is electrically connected through a transmit/receive (T/R) bias circuit to an interface. The system has a central processing unit with a processor configured to execute programmable instructions which when executed by the processor cause the processor to conduct circuit tests at predetermined intervals for the at least one coil, acquire data for the at least one coil to construct a data log with a plurality of input events, and algorithmically filter and analyze the plurality of input events to create an output configured to predict a failure event of the at least one coil. A method for analyzing and acquiring fault conditions is also provided.