The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 20, 2013
Filed:
Apr. 21, 2009
Herman Sontrop, Eindhoven, NL;
Wilhelmus Franciscus Johannes Verhaegh, Eindhoven, NL;
Rene Van Den Ham, Eindhoven, NL;
Herman Sontrop, Eindhoven, NL;
Wilhelmus Franciscus Johannes Verhaegh, Eindhoven, NL;
Rene Van Den Ham, Eindhoven, NL;
Koninklijke Philips N.V., Eindhoven, NL;
Abstract
A classification system () for classification of bio molecular data is provided. An input of the system receives a plurality of features () of a sample to be classified and a plurality of respective error estimates (). A statistical module () associates probability density functions () with the features, wherein variances of the probability density functions depend on the error estimates. A replication module () produces a plurality of perturbed replicas () of the sample, wherein the features are randomly perturbed according to the corresponding respective probability density functions. A classifier () classifies the perturbed replicas based on the perturbed features. An analyzer () classifies the sample to be classified based on a statistical analysis of the classified replicas () to obtain a sample classification ().