The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 8515182 B1

PDF
Full Text
Expired
Date of Patent:
Aug. 20, 2013

Filed:

Oct. 17, 2010
Applicants:

Soroosh Rezazadeh, Montreal, CA;

Stephane Coulombe, Brossard, CA;

Inventors:

Soroosh Rezazadeh, Montreal, CA;

Stephane Coulombe, Brossard, CA;

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/48 (2006.01);
U.S. Cl.
CPC ...
Abstract

Method and system for determining a measure of quality for images by using multi-level decomposition are presented. Multi-level decomposition of images is performed in the wavelet domain producing subbands at each level of decomposition. Aggregation of subbands is performed across multiple levels to produce an accurate measure of image quality. By aggregating only selected subbands the computational complexity of the method is greatly reduced.


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Rezazadeh, Soroosh. (2013). Method and system for determining a quality measure for an image using multi-level decomposition of images (U.S. Patent No. 8515182). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8515182

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