The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 20, 2013
Filed:
May. 13, 2009
Daniel Gagnon, Twinsburg, OH (US);
Patrick Olivier, Solon, OH (US);
Parmeshwar Kishore Khurd, Shaker Heights, OH (US);
Daniel Gagnon, Twinsburg, OH (US);
Patrick Olivier, Solon, OH (US);
Parmeshwar Kishore Khurd, Shaker Heights, OH (US);
Koninklijke Philips N.V., Eindhoven, NL;
Abstract
A diagnostic imaging device includes detector elements () for detecting γ-rays indicative of nuclear decay events. The detected γ-rays are used to produce lines of response (LORs) (), which are time stamped () and stored in list mode. The LORs are reconstructed () into an image. An image analysis processor () analyzes the image for motion artifacts and iteratively adjusts an event transform processor () to transform selected LORs to minimize the motion artifacts. If the transformed LOR () does not correspond with a pair of detector elements (), closest detector elements () are determined. Candidate LORs () are created between the closest and neighboring detector elements. An event location () on an LOR () is determined from the time-of-flight (TOF) information and then transformed () to generate a transformed event location (). The candidate LOR () which most nearly intersects the transformed event location () and the appropriately updated TOF information is selected for use in image reconstruction.