The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 20, 2013
Filed:
Dec. 11, 2007
Christian Baeumer, Aachen, DE;
Roger Steadman Booker, Aachen, DE;
Gereon Vogtmeier, Aachen, DE;
Thomas Scheel, Stolberg, DE;
Christoph Loef, Aachen, DE;
Christian Baeumer, Aachen, DE;
Roger Steadman Booker, Aachen, DE;
Gereon Vogtmeier, Aachen, DE;
Thomas Scheel, Stolberg, DE;
Christoph Loef, Aachen, DE;
Koninklijke Philips N.V., Eindhoven, NL;
Abstract
The invention relates to an X-ray imaging device, particularly a Spectral-CT scanner, that comprises an X-ray source for generating X-radiation with an energy spectrum which varies continuously during an observation period. In a preferred embodiment, the radiation is attenuated in an object according to an energy-dependent attenuation coefficient μ, the transmitted radiation is measured by sensor units of a detector, and the resulting measurement signal is sampled and A/D converted. This is preferably done by an oversampling A/D converter, for example a ΣΔ-ADC. The tube voltage that drives the X-ray source is sampled with high frequency. In an evaluation system, these sampled measurement values can be associated with corresponding effective energy spectra to determine the energy dependent attenuation coefficient μ.