The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 20, 2013

Filed:

Sep. 26, 2012
Applicant:

Thermo Niton Analyzers Llc, Billerica, MA (US);

Inventors:

Stanislaw Piorek, Hillsborough, NJ (US);

Stephen I. Shefsky, Brooklyn, NY (US);

Michael E. Dugas, Londonderry, NH (US);

Assignee:

Thermo Niton Analyzers LLC, Billerica, MA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 23/223 (2006.01);
U.S. Cl.
CPC ...
Abstract

Techniques disclosed herein include systems and methods for identifying counterfeit gold jewelry and other counterfeit gold items. Techniques include determining—using a non-destructive mechanism—whether an item of interest (such as an article represented as true gold) is solid gold or a gold-plated object. Techniques include using an X-ray fluorescence (XRF) analyzer to differentiate true gold from gold plating. The XRF analyzer can distinguish between gold plating and bulk gold material by comparing a ratio of L-alpha and L-beta x-ray lines of gold. The analyzer measures a ratio of intensities of characteristic L-lines of gold using X-ray fluorescence (XRF) spectroscopy. When implemented using an XRF analyzer, the system nondestructively determines whether a test object is made of solid gold/gold alloy or has gold plating only.


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