The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 20, 2013
Filed:
Feb. 02, 2009
Anders Ullberg, Åby, SE;
Erik Odén, Täby, SE;
Ragnar Kullenberg, Oskarström, SE;
Frédrik Danielsson, Solna, SE;
Anders Ullberg, Åby, SE;
Erik Odén, Täby, SE;
Ragnar Kullenberg, Oskarström, SE;
Frédrik Danielsson, Solna, SE;
Orexplore AB, Kista, SE;
Abstract
An apparatus and a method for X-ray fluorescence analysis of a mineral sample is disclosed. The apparatus comprises an X-ray source () for generating an X-ray beam to irradiate the mineral sample; at least one fluorescence detector () for measuring fluorescent radiation emitted by the mineral sample when irradiated by the X-ray beam; and a processing unit for providing an analysis of the mineral sample based on the measurements made by the at least one fluorescence detector (). Further, the apparatus comprises a sample container () arranged to hold the mineral sample during the irradiation, wherein the sample container is arranged to provide at least two different irradiation paths through said mineral sample during irradiation. An advantage with this arrangement is that it enables analysis of elements having a wide range of atomic numbers in a single sample with improved reliability and accuracy. This results in maximized detectability for a wide range of elements, while reducing the number of samples that needs to be prepared. The present invention also leads to simplified sample preparation, and to a faster and more cost-efficient analysis. This makes the apparatus particularly useful for field use.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile