The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 20, 2013

Filed:

Jul. 06, 2010
Applicants:

Zhifeng Huang, Beijing, CN;

Zhiqiang Chen, Beijing, CN;

LI Zhang, Beijing, CN;

Zhentian Wang, Beijing, CN;

Yuxiang Xing, Beijing, CN;

Ziran Zhao, Beijing, CN;

Yongshun Xiao, Beijing, CN;

Inventors:

Zhifeng Huang, Beijing, CN;

Zhiqiang Chen, Beijing, CN;

Li Zhang, Beijing, CN;

Zhentian Wang, Beijing, CN;

Yuxiang Xing, Beijing, CN;

Ziran Zhao, Beijing, CN;

Yongshun Xiao, Beijing, CN;

Assignees:

Tsinghua University, Beijing, CN;

Nuctech Company Limited, Beijing, CN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 6/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

An x-ray imaging technology, performing an x-ray dark-field CT imaging of an examined object using an imaging system which comprises an x-ray source, two absorbing gratings Gand G, an x-ray detector, a controller and a data processing unit, comprising the steps of: emitting x-rays to the examined object; enabling one of the two absorbing gratings Gand Gto perform phase stepping motion within at least one period range thereof; where in each phase stepping step, the detector receives the x-ray and converts it into an electric signal; wherein through the phase stepping of at least one period, the x-ray intensity at each pixel point on the detector is represented as an intensity curve; calculating a second moment of scattering angle distribution for each pixel, based on a contrast of the intensity curve at each pixel point on the detector and an intensity curve without presence of the examined object; taking images of the object at various angles, then obtaining an image with scattering information of the object in accordance with a CT reconstruction algorithm.


Find Patent Forward Citations

Huang, Zhifeng. (2013). X-ray dark-field imaging system and method (U.S. Patent No. 8515002). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8515002

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Loading…