The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 20, 2013
Filed:
Mar. 30, 2012
Harumitsu Miyashita, Nara, JP;
Yasumori Hino, Nara, JP;
Junya Shiraishi, Nagano, JP;
Shoei Kobayashi, Kanagawa, JP;
Harumitsu Miyashita, Nara, JP;
Yasumori Hino, Nara, JP;
Junya Shiraishi, Nagano, JP;
Shoei Kobayashi, Kanagawa, JP;
Panasonic Corporation, Osaka, JP;
Sony Corporation, Tokyo, JP;
Abstract
A reproduction signal evaluation method evaluates the quality of a reproduction signal reproduced from an information recording medium based on a binary signal generated from the reproduction signal using a PRML signal processing system. A pattern extraction step extracts, from the binary signal, a specific state transition pattern which has the possibility of causing a bit error; a step computes a differential metric based on the binary signal; an extraction step extracts the differential metric which is not greater than a predetermined signal processing threshold; a step determines a mean value of the differential metrics which are not greater than the signal processing threshold and extracted in the extraction step; a standard deviation computing step determines a standard deviation which corresponds to an error rate predicted from the mean value; and an evaluation step evaluates a quality of the reproduction signal using the standard deviation.