The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 20, 2013
Filed:
Sep. 29, 2011
Tomoyuki Mitsuhashi, Kanagawa, JP;
Yuichi Nishikuni, Kanagawa, JP;
Fumihiko Ogasawara, Kanagawa, JP;
Toshio Koriyama, Kanagawa, JP;
Tomoyuki Mitsuhashi, Kanagawa, JP;
Yuichi Nishikuni, Kanagawa, JP;
Fumihiko Ogasawara, Kanagawa, JP;
Toshio Koriyama, Kanagawa, JP;
Fuji Xerox Co., Ltd., Tokyo, JP;
Abstract
A line width measuring device includes an acquisition unit, an extraction unit, and a generation unit. The acquisition unit that acquires a binary image that is obtained by reading a medium having a line width sample printed thereon with an image reading device, the line width sample representing output characteristics regarding a line width of an image forming device. The extraction unit that extracts a displacement amount of steps that are repeatedly generated in an image corresponding to the line width sample in the binary image by reading the medium with the image reading device in an orientation such that the line width sample has an angle θ (0°<θ<90°) with respect to a main scanning direction of image reading. The generation unit that generates line width information regarding a width of the line width sample by using the displacement amount extracted by the extraction unit.