The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 20, 2013
Filed:
Apr. 14, 2011
Yuichi Ogawa, Aoba-Ku, JP;
Shinichiro Hayashi, Miyagi, JP;
Seiji Kamba, Nagaokakyo, JP;
Takashi Kondo, Nagaokakyo, JP;
Yuichi Ogawa, Aoba-Ku, JP;
Shinichiro Hayashi, Miyagi, JP;
Seiji Kamba, Nagaokakyo, JP;
Takashi Kondo, Nagaokakyo, JP;
Tohoku University, Miyagi, JP;
Murata Manufacturing Co., Ltd., Nagaokakyo-Shi, JP;
Abstract
A sample analysis method is provided for analyzing a sample having a permeability to terahertz radiation and accurately measure the composition, physical properties, mass and dimensions of a very small sample or a minute amount of sample by irradiating the sample with terahertz radiation. In the method, a reflective member is provided adjoining a first principal surface of the sample, an entrance member is provided adjoining a second principal surface of the sample, terahertz radiation is delivered from outside of entrance member towards the sample, and the sample is analyzed using an interference wave generated from a first-surface reflected wave at the interface between the first principal surface of the sample and the reflective member and a second-surface reflected wave at the interface between the second principal surface of the sample and the entrance member.