The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 20, 2013
Filed:
Jan. 06, 2010
Arthur H. Carrieri, Abingdon, MD (US);
Jack Copper, Pittsburgh, PA (US);
David J. Owens, Kingsville, MD (US);
Erik S. Roese, Baltimore, MD (US);
Jerold R. Bottiger, Aberdeen, MD (US);
Kevin C. Hung, Baltimore, MD (US);
Arthur H. Carrieri, Abingdon, MD (US);
Jack Copper, Pittsburgh, PA (US);
David J. Owens, Kingsville, MD (US);
Erik S. Roese, Baltimore, MD (US);
Jerold R. Bottiger, Aberdeen, MD (US);
Kevin C. Hung, Baltimore, MD (US);
The United States of America as Represented by the Secretary of the Army, Washington, DC (US);
Abstract
A system, apparatus, and method of generating Stokes vectors, a Mueller matrix, and polarized scattering from an aerosol aggregate includes providing an incident infrared laser beam; causing the incident infrared laser beam to be polarization-modulated using variable stress/strain birefringence imposed on a ZnSe crystal; defining a Stokes vector associated with the incident infrared laser beam; scattering the incident infrared laser beam from an aggregate aerosol comprising interferents and analyte particles; producing a scattered-beam reactant Stokes vector by causing the scattered incident infrared laser beam to be polarization-modulated; generating a Mueller matrix by taking a transformation of the Stokes vector; and identifying the analyte using the Mueller matrix. The Mueller matrix may comprise M-elements that are functions of a wavelength of the infrared laser beam, backsattering orientation of the infrared laser beam, and a shape and size of the interferents and analyte particles.